(9150X) 1.5m Single Echelle Spectrometer
本階梯光柵光譜儀是為衍射極限而專門設(shè)計(jì)的!
全光譜覆蓋無(wú)縫可調(diào)150nm范圍內(nèi)單程模式分辨率~2pm，
本光譜儀采用兩個(gè)光柵， 二個(gè)1.5米F. L.拋物面反射器和一個(gè)校正器透鏡，產(chǎn)生交叉分散分級(jí)光柵圖（echellegram），
記錄器為3K X3K冷卻CCD照相機(jī)（12U像素），分散1 pm/pixel。
使用3段圖像切片機(jī)把細(xì)而長(zhǎng)的分級(jí)光柵圖投射為方形CCD格式，以波長(zhǎng)覆蓋和分辨率。
This is an Echelle Spectrometer designed for diffraction limit operation, that provides a full spectrum coverage without gaps over a tunable 150nm range at a resolution of ~2pm in single pass mode. The spectrometer uses two gratings, two 1.5m f.l. parabolic reflectors and a corrector lens to produce a cross-dispersed echellegram that is recorded on a 3k x 3k cooled CCD camera with 12u pixels, at a dispersion of 1 pm/pixel. The long, thin echellegram is fit to the square CCD format using a 3 section image slicer, to maximize wavelength coverage and resolution.
Input optics include a micrometer adjustable rectangular input slit and a computer controlled source selector that can switch between four available input ports, useful in calibration.
Operational specifications are (for 31.5 l/mm 150x50 mm echelle, single pass)
* Dispersion: 1pm/pixel; (diffraction limit = 1pm)
* Wavelength coverage: 150nm band, position continuously selectable.
No gap coverage up to 800nm. Camera coverage 300nm-900nm.
* Aperture f/25.
* Input slit: rectangular, continuously adjustable 0-500um.
* Source selector to switch between four inputs.
* Calibration facilities for wavelength and intensity.
* Software to transfer raw images to permanent storage at the maximum possible rate, to transform and store as spectra corrected for wavelength & intensity.
Please note that for full frame digitization at 12 bits the transfer rate is 10seconds per frame. Smaller frame sections can be transferred at correspondingly faster rates.
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